Evidence of nonplanar field emission via secondary electron detection in near field emission scanning electron microscopy
نویسندگان
چکیده
منابع مشابه
Cryo field emission scanning electron microscopy.
Low-temperature scanning electron microscopy (cryoSEM) was introduced in the early 1970s, shortly after the appearance of the first commercial scanning electron microscopes. This technique has been utilized widely in plant biology, the food and paper industry, X-ray analytical studies, and material sciences (8). Major advantages of cryoSEM include being able to avoid deleterious changes associa...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2009
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.3117224